School of Engineering, Industrial Engineering

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  • Research Output

    A generalised uncertain decision tree for defect classification of multiple wafer maps

    Kim, B., Jeong, Y. S., Tong, S. H. & Jeong, M. K., May 2 2020, In : International Journal of Production Research. 58, 9, p. 2805-2821 17 p.

    Research output: Contribution to journalArticle

  • 1 Scopus citations
  • 2 Scopus citations