Projects per year
Fingerprint Dive into the research topics where School of Engineering, Industrial Engineering is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.
Software reliability
Engineering & Materials Science
Costs
Engineering & Materials Science
Machining
Engineering & Materials Science
Degradation
Engineering & Materials Science
Testing
Engineering & Materials Science
Redundancy
Engineering & Materials Science
Reliability analysis
Engineering & Materials Science
Inspection
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Profiles
Projects 2008 2017
- 7 Finished
Collaborative Research: Network Protection Under Uncertainty
National Science Foundation (NSF)
9/1/14 → 8/31/17
Project: Research project
Law enforcement
National security
Decision making
Resource allocation
Uncertainty
Collaborative Research: Process Monitoring And Control In Autocorrelated Multistage Manufacturing Processes
National Science Foundation (NSF)
9/1/12 → 8/31/15
Project: Research project
Process monitoring
Process control
Monitoring
Industry
Chemical industry
Eager: Pulsed Laser Assisted Exfoliation Of Single Crystalline Sic Thin Layers For Cost Effective Micro-Device Fabrication
National Science Foundation (NSF)
9/1/11 → 8/31/12
Project: Research project
silicon carbides
pulsed lasers
costs
fabrication
ion implantation
Research Output 1975 2019
3D FEM simulation of the turning process of stainless steel 17-4PH with differently texturized cutting tools
Liu, G., Huang, C., Su, R., Ozel, T., Liu, Y. & Xu, L., May 1 2019, In : International Journal of Mechanical Sciences. 155, p. 417-429 13 p.Research output: Contribution to journal › Article
Stainless Steel
Cutting tools
stainless steels
finite element method
Stainless steel
1
Citation
(Scopus)
A Deep Neural Network-based method for estimation of 3D lifting motions
Mehrizi, R., Peng, X., Xu, X., Zhang, S. & Li, K., Feb 14 2019, In : Journal of Biomechanics. 84, p. 87-93 7 p.Research output: Contribution to journal › Article
Video cameras
Analysis of variance (ANOVA)
Controlled Environment
Body Image
Deep neural networks
A generalised uncertain decision tree for defect classification of multiple wafer maps
Kim, B., Jeong, Y. S., Tong, S. H. & Jeong, M-K., Jan 1 2019, In : International Journal of Production Research.Research output: Contribution to journal › Article
Decision trees
Defects
Semiconductor materials
Dynamic random access storage
Bins