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Eric Garfunkel

 https://orcid.org/0000-0002-5708-321X
Calculated based on number of publications stored in Pure and citations from Scopus
1979 …2024

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  • 2008

    Defects in CMOS gate dielectrics

    Garfunkel, E., Gavartin, J. & Bersuker, G., Jan 1 2008, Defects in Microelectronic Materials and Devices. CRC Press, p. 341-358 18 p.

    Research output: Chapter in Book/Report/Conference proceeding › Chapter