Skip to main navigation Skip to search Skip to main content

A Bayesian growth and yield model for slash pine plantations

  • Edwin J. Green
  • , William E. Strawderman

Research output: Contribution to journalArticlepeer-review

Abstract

We formulate a traditional growth and yield model as a Bayes model. We attempt to introduce as few new assumptions as possible. Zellner's Bayesian method of moments procedure is used, because the published model did not include any distributional assumptions. We generate predictive posterior samples for a number of stand variables using the Gibbs sampler. The means of the samples compare favorably with the predictions from the published model. In addition, our model delivers distributions of outcomes, from which it is easy to establish measures of uncertainty, such as highest posterior density regions.

Original languageEnglish (US)
Pages (from-to)285-300
Number of pages16
JournalJournal of Applied Statistics
Volume23
Issue number2-3
DOIs
StatePublished - 1996

All Science Journal Classification (ASJC) codes

  • Statistics and Probability
  • Statistics, Probability and Uncertainty

Fingerprint

Dive into the research topics of 'A Bayesian growth and yield model for slash pine plantations'. Together they form a unique fingerprint.

Cite this