TY - JOUR
T1 - A Bayesian predictive software reliability model with pseudo-failures
AU - Pham, L.
AU - Pham, H.
N1 - Funding Information:
Manuscript received July 21, 1998; revised February 24, 2001. This work was supported in part by the U.S. Federal Aviation Administration. This paper was recommended by Associate Editor P. Willett. The authors are with the Department of Industrial Engineering, Rutgers University, Piscataway, NJ 08854 USA ([email protected]). Publisher Item Identifier S 1083-4427(01)04375-2.
PY - 2001/5
Y1 - 2001/5
N2 - In a previous paper, a Bayesian software reliability model with stochastically decreasing hazard rate has been presented. Within any given failure time interval, the hazard rate is a function of both total testing time as well as number of encountered failures. In this paper, to improve the predictive performance of our previously proposed model, a pseudo-failure is inserted whenever there is a period of failure-free execution equals (1 - α) th percentile of the predictive distribution for time until the next failure has passed. We apply the enhanced model with pseudo-failures inserted to actual software failure data and show it gives better results under the sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models.
AB - In a previous paper, a Bayesian software reliability model with stochastically decreasing hazard rate has been presented. Within any given failure time interval, the hazard rate is a function of both total testing time as well as number of encountered failures. In this paper, to improve the predictive performance of our previously proposed model, a pseudo-failure is inserted whenever there is a period of failure-free execution equals (1 - α) th percentile of the predictive distribution for time until the next failure has passed. We apply the enhanced model with pseudo-failures inserted to actual software failure data and show it gives better results under the sum of square errors criteria as compared to previous Bayesian models and other existing times between failures models.
KW - Likelihood ratios
KW - Software reliability
KW - Sum of square errors
KW - Time between failures
KW - Weibull distribution
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U2 - 10.1109/3468.925663
DO - 10.1109/3468.925663
M3 - Article
AN - SCOPUS:0035329959
SN - 1083-4427
VL - 31
SP - 233
EP - 238
JO - IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.
JF - IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans.
IS - 3
ER -