Keyphrases
Control Approach
100%
Iterative Learning Control
100%
Atomic Force Microscope Imaging
100%
Feedback Control
60%
Precision Positioning
60%
Atomic Force Microscope
40%
Atomic Force Microscope Probe
40%
Law
20%
In(III)
20%
Control Method
20%
Model Uncertainty
20%
Iterative Control
20%
Fast Imaging
20%
Advanced Control
20%
High-speed Imaging
20%
Contact Imaging
20%
Causality Constraint
20%
Inversion Method
20%
Uncertainty Effect
20%
Robust Inversion
20%
Tracking Error
20%
Precision Tracking
20%
Controller Design
20%
Experimental Implementation
20%
Imaging Speed
20%
Bounded Tracking
20%
Control Precision
20%
Engineering
Atomic Force Microscope
100%
Iterative Learning Control
100%
Feedforward Control
33%
Experimental Result
16%
Model Uncertainty
16%
Contact Mode
16%
Inversion Technique
16%
Axis Direction
16%
Controller Design
16%
Feedback Control
16%