A current cycle feedback iterative learning control approach to AFM imaging

Ying Wu, Qingze Zou, Chanmin Su

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations


In this article, we proposed a novel current cycle feedback (CCF) iterative learning control (ILC) approach to achieve high-speed imaging on atomic force microscope (AFM). AFM-imaging requires precision positioning of the AFM probe relative to the sample in 3-D (x-y-z) dimension. It has been demonstrated that with advanced control techniques such as the inversion-based iterative-control (IIC) technique, precision positioning of the AFM probe in the lateral (x-y) direction can be successfully achieved. Additional challenges, however, must be overcome to achieve precision positioning of the AFM-probe in the vertical direction. The main contribution of this article is the developement of the CCF-ILC approach to the AFM z-axis control. Particularly, the proposed CCF-ILC controller design utilizes the recently-developed robust-inversion technique to minimize the model uncertainty effect on the feedforward control, and remove the causality constraints existing in other CCF-ILC approaches. Experimental results for AFM imaging are presented and discussed to illustrate the proposed method.

Original languageEnglish (US)
Title of host publication2008 American Control Conference, ACC
Number of pages6
StatePublished - 2008
Externally publishedYes
Event2008 American Control Conference, ACC - Seattle, WA, United States
Duration: Jun 11 2008Jun 13 2008

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619


Other2008 American Control Conference, ACC
Country/TerritoryUnited States
CitySeattle, WA

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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