TY - GEN
T1 - A hybrid face recognition method using Markov random fields
AU - Huang, Rui
AU - Pavlovic, Vladimir
AU - Metaxas, Dimitris N.
PY - 2004
Y1 - 2004
N2 - We propose a hybrid face recognition method that combines holistic and feature analysis-based approaches using a Markov random field (MRF) model. The face images are divided into small patches, and the MRF model is used to represent the relationship between the image patches and the patch ID's. The MRF model is first learned from the training image patches, given a test image. The most probable patch ID's are then inferred using the belief propagation (BP) algorithm. Finally, the ID of the test image is determined by a voting scheme from the estimated patch ID's. Experimental results on several face datasets indicate the significant potential of our method.
AB - We propose a hybrid face recognition method that combines holistic and feature analysis-based approaches using a Markov random field (MRF) model. The face images are divided into small patches, and the MRF model is used to represent the relationship between the image patches and the patch ID's. The MRF model is first learned from the training image patches, given a test image. The most probable patch ID's are then inferred using the belief propagation (BP) algorithm. Finally, the ID of the test image is determined by a voting scheme from the estimated patch ID's. Experimental results on several face datasets indicate the significant potential of our method.
UR - http://www.scopus.com/inward/record.url?scp=10044290357&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=10044290357&partnerID=8YFLogxK
U2 - 10.1109/ICPR.2004.1334492
DO - 10.1109/ICPR.2004.1334492
M3 - Conference contribution
AN - SCOPUS:10044290357
SN - 0769521282
T3 - Proceedings - International Conference on Pattern Recognition
SP - 157
EP - 160
BT - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
A2 - Kittler, J.
A2 - Petrou, M.
A2 - Nixon, M.
T2 - Proceedings of the 17th International Conference on Pattern Recognition, ICPR 2004
Y2 - 23 August 2004 through 26 August 2004
ER -