Abstract
A device that can assume several states of failure is called a multistate device. Closed form solutions for both the steady-state and time-dependent availability of such a device and probability of failure in state i at any given time t are developed, largely in Laplace Transform form.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 81-82 |
| Number of pages | 2 |
| Journal | IEEE Transactions on Reliability |
| Volume | R-28 |
| Issue number | 1 |
| DOIs | |
| State | Published - Apr 1979 |
All Science Journal Classification (ASJC) codes
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering
Keywords
- Multistate device
- Time-dependent availability