TY - GEN
T1 - An adaptive filtering approach to dynamics effect compensation in nanoscale broadband viscoelasticity measurements of soft materials
AU - Xie, Ping
AU - Xu, Zhonghua
AU - Zou, Qingze
AU - Xu, Hongbing
PY - 2009
Y1 - 2009
N2 - In this article, an adaptive filtering approach to compensate for instrument dynamics effect on nanoscale broadband material viscoelasticity measurements is proposed. Although a large frequency range of measurement (i.e., broadband) is desirable in mechanical property characterization of materials, the measurement frequency range is, in general, limited by the dynamics of the measurement instrument. Such a limit arises because the instrument dynamics can be convoluted with the mechanical response of the material in the measured data, particularly when the excitation force profile consists of multiple frequencies and becomes fast. The contribution of this article is the use of adaptive filtering approach to eliminate the instrument dynamics effect in nanoscale broadband viscoelasticity measurement using atomic force microscope (AFM). The proposed approach is illustrated by implementing it to compensate for the dynamic effects in the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
AB - In this article, an adaptive filtering approach to compensate for instrument dynamics effect on nanoscale broadband material viscoelasticity measurements is proposed. Although a large frequency range of measurement (i.e., broadband) is desirable in mechanical property characterization of materials, the measurement frequency range is, in general, limited by the dynamics of the measurement instrument. Such a limit arises because the instrument dynamics can be convoluted with the mechanical response of the material in the measured data, particularly when the excitation force profile consists of multiple frequencies and becomes fast. The contribution of this article is the use of adaptive filtering approach to eliminate the instrument dynamics effect in nanoscale broadband viscoelasticity measurement using atomic force microscope (AFM). The proposed approach is illustrated by implementing it to compensate for the dynamic effects in the broadband viscoelasticity measurement of a polydimethylsiloxane (PDMS) sample using AFM.
UR - http://www.scopus.com/inward/record.url?scp=77950816500&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77950816500&partnerID=8YFLogxK
U2 - 10.1109/CDC.2009.5400599
DO - 10.1109/CDC.2009.5400599
M3 - Conference contribution
AN - SCOPUS:77950816500
SN - 9781424438716
T3 - Proceedings of the IEEE Conference on Decision and Control
SP - 8284
EP - 8289
BT - Proceedings of the 48th IEEE Conference on Decision and Control held jointly with 2009 28th Chinese Control Conference, CDC/CCC 2009
T2 - 48th IEEE Conference on Decision and Control held jointly with 2009 28th Chinese Control Conference, CDC/CCC 2009
Y2 - 15 December 2009 through 18 December 2009
ER -