@article{dd11bb1be3c14c11ba1f40cf87e12276,
title = "An extended linear hazard regression model with application to time-dependent dielectric breakdown of thermal oxides",
abstract = "We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.",
author = "Elsayed, {Elsayed A.} and Haitao Liao and Xindong Wang",
note = "Funding Information: The authors would like to thank Professor J. A. Cooper of Purdue University for providing us with a valuable reference and the real laboratory data. We would like to thank the referees for their helpful comments and suggestions. We would like to acknowledge the financial support of the NSF/Industry-University Cooperative Research Center on Quality and Reliability Engineering, Rutgers University-Arizona State University. Funding Information: Dr. E. A. Elsayed is a Professor in the Department of Industrial Engineering, Rutgers, the State University of New Jersey. He is also Director of the NSF/Industry/University Co-operative Research Center for Quality and Reliability Engineering, Rutgers-Arizona State University. His research interests are in the areas of quality and reliability engineering and Production Planning and Control. He is a co-author of Quality Engineering in Production Systems, McGraw Hill Book Company, 1989. He is the author of Reliability Engineering, Addison-Wesley, 1996. These two books received the 1990 and 1997 IIE Joint Publishers Book-of-the-Year Award respectively. Dr. Elsayed is also a co-author of Analysis and Control of Production Systems, Prentice-Hall, 2nd Edition, 1994. He is the author and co-author of work published in IIE Transactions, IEEE Transactions, and the International Journal of Production Research. His research has been funded by the DoD, FAA, NSF and industry. Dr. Elsayed has been a consultant for AT&T Bell Laboratories, Ingersoll-Rand, Johnson & Johnson, Personal Products, AT&T Communications, Ethicon and other companies. Dr. Elsayed was the Editor-in-Chief of IIE Transactions and the Editor of IIE Transactions on Quality and Reliability Engineering. He is also an Editor for the International Journal of Reliability, Quality and Safety Engineering. He serves on the editorial boards of other journals such as International Journal of Production Research and Computers and Industrial Engineering.",
year = "2006",
month = apr,
doi = "10.1080/07408170500208362",
language = "English (US)",
volume = "38",
pages = "329--340",
journal = "IISE Transactions",
issn = "2472-5854",
publisher = "Taylor and Francis Ltd.",
number = "4",
}