We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the effect of proportional hazards, time-varying coefficients and also time-scale changes. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained using existing accelerated life testing models. We utilize the ELHR model to study the time-dependent dielectric breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.
|Original language||English (US)|
|Number of pages||12|
|Journal||IIE Transactions (Institute of Industrial Engineers)|
|State||Published - Apr 2006|
All Science Journal Classification (ASJC) codes
- Industrial and Manufacturing Engineering