An integrated approach to piezoactuator positioning in high-speed atomic force microscope imaging

Yan Yan, Ying Wu, Qingze Zou, Chanmin Su

Research output: Contribution to journalArticlepeer-review

27 Scopus citations


In this paper, an integrated approach to achieve high-speed atomic force microscope (AFM) imaging of large-size samples is proposed, which combines the enhanced inversion-based iterative control technique to drive the piezotube actuator control for lateral x-y axis positioning with the use of a dual-stage piezoactuator for vertical z -axis positioning. High-speed, large-size AFM imaging is challenging because in high-speed lateral scanning of the AFM imaging at large size, large positioning error of the AFM probe relative to the sample can be generated due to the adverse effects-the nonlinear hysteresis and the vibrational dynamics of the piezotube actuator. In addition, vertical precision positioning of the AFM probe is even more challenging (than the lateral scanning) because the desired trajectory (i.e., the sample topography profile) is unknown in general, and the probe positioning is also effected by and sensitive to the probe-sample interaction. The main contribution of this article is the development of an integrated approach that combines advanced control algorithm with an advanced hardware platform. The proposed approach is demonstrated in experiments by imaging a large-size (50 μm) calibration sample at high-speed (50 Hz scan rate).

Original languageEnglish (US)
Article number073704
JournalReview of Scientific Instruments
Issue number7
StatePublished - 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation


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