An iterative based feedforward-feedback control approach to high-speed AFM imaging

Ying Wu, Qingze Zou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

AFM imaging requires precision positioning of the AFM probe relative to the sample in all x-y-z axes, especially the vertical z-axis direction. Recently, the currentcycle- feedback iterative-learning-control (CCF-ILC) approach is proposed for high-speed AFM imaging. The CCF-ILC feedforward-feedback 2 degree-of-freedom (DOF) controller design has been successfully implemented for iteratively imaging on one scanline. In this article, we extend this CCFILC approach to the entire imaging of samples. The main contribution of this article is the analysis and the use of the CCF-ILC approach for tracking sample profiles with variations between scanlines (called line-to-line sample variations). The convergence (stability) of the CCF-ILC system is analyzed for the general case where the line-to-line sample variation occurs at each iteration. The allowable line-to-line sample profile variation is quantified. The performance improvement of the CCF-ILC is discussed by comparing the tracking error of the CCF-ILC technique to that of using feedback control alone. The proposed CCF-ILC control approach is illustrated by implementing it to the z-axis direction control in AFM imaging. Experimental results show that the imaging speed can be significantly increased by using the proposed approach.

Original languageEnglish (US)
Title of host publication2009 American Control Conference, ACC 2009
Pages1658-1663
Number of pages6
DOIs
StatePublished - 2009
Externally publishedYes
Event2009 American Control Conference, ACC 2009 - St. Louis, MO, United States
Duration: Jun 10 2009Jun 12 2009

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619

Other

Other2009 American Control Conference, ACC 2009
Country/TerritoryUnited States
CitySt. Louis, MO
Period6/10/096/12/09

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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