Angle-resolved Auger-photoelectron coincidence spectroscopy (AR-APECS) of the Ge(100) surface

G. Stefani, Robert Bartynski, R. Gotter, A. Ruocco, M. T. Butterfield, S. Iacobucci

Research output: Contribution to journalArticle

Abstract

We have measured the angular distribution of Ge (formula presented) Auger electrons in coincidence with Ge (formula presented) core photoelectrons along the (001) azimuth of the Ge(100) surface. Intensity modulations arising from diffraction effects are suppressed in the coincidence Auger angular distribution and, when specific emission angles of the photoelectrons are considered, new features appear. We attribute the former effect to enhanced surface specificity of the coincidence technique and the latter to sensitivity of the coincidence measurement to alignment of the core hole state.

Original languageEnglish (US)
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume67
Issue number3
DOIs
StatePublished - Jan 1 2003
Externally publishedYes

Fingerprint

Angular distribution
Photoelectrons
photoelectrons
angular distribution
Spectroscopy
azimuth
spectroscopy
Diffraction
alignment
Modulation
modulation
Electrons
sensitivity
diffraction
electrons

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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abstract = "We have measured the angular distribution of Ge (formula presented) Auger electrons in coincidence with Ge (formula presented) core photoelectrons along the (001) azimuth of the Ge(100) surface. Intensity modulations arising from diffraction effects are suppressed in the coincidence Auger angular distribution and, when specific emission angles of the photoelectrons are considered, new features appear. We attribute the former effect to enhanced surface specificity of the coincidence technique and the latter to sensitivity of the coincidence measurement to alignment of the core hole state.",
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Angle-resolved Auger-photoelectron coincidence spectroscopy (AR-APECS) of the Ge(100) surface. / Stefani, G.; Bartynski, Robert; Gotter, R.; Ruocco, A.; Butterfield, M. T.; Iacobucci, S.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 67, No. 3, 01.01.2003.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Angle-resolved Auger-photoelectron coincidence spectroscopy (AR-APECS) of the Ge(100) surface

AU - Stefani, G.

AU - Bartynski, Robert

AU - Gotter, R.

AU - Ruocco, A.

AU - Butterfield, M. T.

AU - Iacobucci, S.

PY - 2003/1/1

Y1 - 2003/1/1

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AB - We have measured the angular distribution of Ge (formula presented) Auger electrons in coincidence with Ge (formula presented) core photoelectrons along the (001) azimuth of the Ge(100) surface. Intensity modulations arising from diffraction effects are suppressed in the coincidence Auger angular distribution and, when specific emission angles of the photoelectrons are considered, new features appear. We attribute the former effect to enhanced surface specificity of the coincidence technique and the latter to sensitivity of the coincidence measurement to alignment of the core hole state.

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