Abstract
Using medium-energy ion-scattering (MEIS) as an in situ probe of coverage, we have investigated the adsorption of Cu on SiO2 and MgO(001) surfaces at 300 K. For the clean surfaces, only 35% (Cu/SiO2) and 50% (Cu/MgO) of the initially incident Cu atoms stick to the surfaces and are detected by MEIS. Our results are discussed in terms of a model in which desorption competes with migration and sticking of Cu adatoms onto defects and growing Cu nuclei.
Original language | English (US) |
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Pages (from-to) | L887-L892 |
Journal | Surface Science |
Volume | 293 |
Issue number | 3 |
DOIs | |
State | Published - Aug 20 1993 |
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry