Automated visual inspection of SMDs in an industrial environment

E. K. Teoh, D. P. Mital

Research output: Contribution to journalConference articlepeer-review

Abstract

This paper presents the techniques used to inspect for defects on Surface Mount PCBs. Focusses were made on five different types of defects, namely, missing components, misalignment, wrong orientation of I.C. chips, wrong parts and poor solder joints. Thus five separate algorithms had been developed to detect these faults. The technique of windowing was employed to reduce the amount of redundant data to be processed. Preprocessing functions like convolution as well as all image processing tasks are performed on the window regions only, saving tremendously on computation time. Experimental results showed that these algorithms are reliable, fast and cost-effective.

Original languageEnglish (US)
Pages (from-to)38-47
Number of pages10
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1713
DOIs
StatePublished - 1992
Externally publishedYes
EventInternational Conference on Manufacturing Automation 1992 - Hong Kong, Hong Kong
Duration: Aug 1 1992 → …

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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