Avalanche multiplication and breakdown in 4H-SiC diodes

B. K. Ng, J. P.R. David, D. J. Massey, R. C. Tozer, G. J. Rees, F. Yan, J. H. Zhao, M. Weiner

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

The measured photomultiplication and excess noise characteristics of two 4H-SiC p-i-n diodes, with i-region widths of 0.105 μm and 0.285 μm, were modelled using a nonlocal multiplication model to determine the ionization threshold energies and the impact ionization coefficients of 4H-SiC. The modelled ionization coefficients accurately predicted the breakdown voltage of a 0.485 μm p-i-n structure. The breakdown voltage of 4H-SiC calculated using these parameters is approximately 7.2 and 4.6 times higher than that of similar Si and Al0.8Ga0.2As structures respectively. Dead space, the minimum distance required for carriers to equilibrate in the electric field, has to be taken into account to accurately predict the breakdown voltage in thin devices.

Original languageEnglish (US)
Pages (from-to)1069-1072
Number of pages4
JournalMaterials Science Forum
Volume457-460
Issue numberII
DOIs
StatePublished - Jan 1 2004
EventProceedings of the 10th International Conference on Silicon Carbide and Related Materials, ICSCRM 2003 - Lyon, France
Duration: Oct 5 2003Oct 10 2003

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Keywords

  • 4H-SiC
  • Avalanche breakdown
  • Avalanche multiplication
  • Avalanche photodiodes
  • Breakdown voltage
  • Dead space
  • Impact ionization
  • Nonlocal effects

Fingerprint Dive into the research topics of 'Avalanche multiplication and breakdown in 4H-SiC diodes'. Together they form a unique fingerprint.

Cite this