CdZnTe strip detector for arc second imaging and spectroscopy

C. M. Stahle, A. Parsons, L. M. Bartlett, P. Kurczynski, J. F. Krizmanic, L. M. Barbier, S. D. Barthelmy, F. Birsa, N. Gehreis, J. Odom, D. Palmer, C. Sappington, P. Shu, B. J. Teegarden, J. Tueller

Research output: Contribution to journalConference article

13 Scopus citations

Abstract

A CdZnTe strip detector array with capabilities for arc second imaging and spectroscopy is being developed for a space flight gamma-ray burst instrument. Two dimensional strip detectors with 100 |Lim pitch have been fabricated and wire bonded to readout electronics to demonstrate the ability to localize 22 to 122 keV photons to less than 100 |Lim. In addition, good spectral resolution has been achieved. The uniformity of response and relative efficiency of the strip detector will be discussed. Results from electrical characterization which include strip leakage current and strip capacitance will be presented.

Original languageEnglish (US)
Pages (from-to)74-81
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume2859
DOIs
StatePublished - Jul 19 1996
Externally publishedYes
EventHard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications 1996 - Denver, United States
Duration: Aug 4 1996Aug 9 1996

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Arc second imaging
  • Astronomical research
  • CdZnTe
  • Gamma-ray bursts
  • Hard x-ray
  • Spectroscopy
  • Strip detector

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  • Cite this

    Stahle, C. M., Parsons, A., Bartlett, L. M., Kurczynski, P., Krizmanic, J. F., Barbier, L. M., Barthelmy, S. D., Birsa, F., Gehreis, N., Odom, J., Palmer, D., Sappington, C., Shu, P., Teegarden, B. J., & Tueller, J. (1996). CdZnTe strip detector for arc second imaging and spectroscopy. Proceedings of SPIE - The International Society for Optical Engineering, 2859, 74-81. https://doi.org/10.1117/12.245125