Abstract
The optimal design problem for networks with three-state components is the following: select from a given class of networks with n components, each of which can be operative or experience an open-mode or a shorted-mode failure state, the network with maximum reliability. We present an algorithm for solving this problem in the case of two-stage series parallel networks, i.e. networks consisting of a number of series configurations linked in parallel or vice versa. For practically relevant network sizes (up to 100 components), the algorithm is fast.
Original language | English (US) |
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Pages (from-to) | 247-253 |
Number of pages | 7 |
Journal | Microelectronics Reliability |
Volume | 36 |
Issue number | 2 |
DOIs | |
State | Published - Feb 1996 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering