Abstract
A negative feedback control model was developed to predict left ventricular (LV) wall thickness growth over a long time period following the elevation of peak systolic pressure to prescribed values. Time series plots, phase plots and delay maps were obtained for both wall thickness growth with and without delay. LV wall thickness steady-state values were found to change proportionally to the peak systolic pressure.
Original language | English (US) |
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Pages | 37-38 |
Number of pages | 2 |
State | Published - 2002 |
Event | IEEE 28th Annual Northeast Bioengineering Conference - Philadelphia, PA, United States Duration: Apr 20 2002 → Apr 21 2002 |
Other
Other | IEEE 28th Annual Northeast Bioengineering Conference |
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Country | United States |
City | Philadelphia, PA |
Period | 4/20/02 → 4/21/02 |
All Science Journal Classification (ASJC) codes
- Bioengineering