Correlations between electrical and material properties of CVD diamond

C. White, S. Zhao, K. K. Gan, H. Kagan, R. Kass, R. Malchow, F. Morrow, W. Palmer, S. Han, D. Kania, L. S. Pan, S. Schnetzer, R. Stone, R. Teserek, J. Angus, al et al

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ, excess carrier lifetime τ and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

Original languageEnglish (US)
Pages (from-to)589-594
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1994
Externally publishedYes
EventProceedings of the 1994 MRS Spring Meeting - San Francisco, CA, USA
Duration: Apr 4 1994Apr 8 1994

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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