Correlations between electrical and material properties of CVD diamond

C. White; S. Zhao; K. K. Gan; H. Kagan; R. Kass; R. Malchow; F. Morrow; W. Palmer; S. Han; D. Kania; L. S. Pan; S. Schnetzer; R. Stone; R. Teserek; J. Angus; al et al

doi:10.1557/proc-339-589

Correlations between electrical and material properties of CVD diamond

C. White, S. Zhao, K. K. Gan, H. Kagan, R. Kass, R. Malchow, F. Morrow, W. Palmer, S. Han, D. Kania, L. S. Pan, S. Schnetzer, R. Stone, R. Teserek, J. Angus, al et al

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ, excess carrier lifetime τ and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

Original language	English (US)
Pages (from-to)	589-594
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	339
DOIs	https://doi.org/10.1557/proc-339-589
State	Published - 1994
Externally published	Yes
Event	Proceedings of the 1994 MRS Spring Meeting - San Francisco, CA, USA Duration: Apr 4 1994 → Apr 8 1994

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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title = "Correlations between electrical and material properties of CVD diamond",

abstract = "The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ, excess carrier lifetime τ and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.",

author = "C. White and S. Zhao and Gan, {K. K.} and H. Kagan and R. Kass and R. Malchow and F. Morrow and W. Palmer and S. Han and D. Kania and Pan, {L. S.} and S. Schnetzer and R. Stone and R. Teserek and J. Angus and {et al}, al",

year = "1994",

doi = "10.1557/proc-339-589",

language = "English (US)",

volume = "339",

pages = "589--594",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1994 MRS Spring Meeting ; Conference date: 04-04-1994 Through 08-04-1994",

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TY - JOUR

T1 - Correlations between electrical and material properties of CVD diamond

AU - White, C.

AU - Zhao, S.

AU - Gan, K. K.

AU - Kagan, H.

AU - Kass, R.

AU - Malchow, R.

AU - Morrow, F.

AU - Palmer, W.

AU - Han, S.

AU - Kania, D.

AU - Pan, L. S.

AU - Schnetzer, S.

AU - Stone, R.

AU - Teserek, R.

AU - Angus, J.

AU - et al, al

PY - 1994

Y1 - 1994

N2 - The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ, excess carrier lifetime τ and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

AB - The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ, excess carrier lifetime τ and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

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U2 - 10.1557/proc-339-589

DO - 10.1557/proc-339-589

M3 - Conference article

AN - SCOPUS:0028752216

SN - 0272-9172

VL - 339

SP - 589

EP - 594

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1994 MRS Spring Meeting

Y2 - 4 April 1994 through 8 April 1994

ER -

Correlations between electrical and material properties of CVD diamond

Abstract

All Science Journal Classification (ASJC) codes

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