Abstract
4H-SiC visible-blind reach-through avalanche photodiodes (RAPDs) are designed and fabricated with mesa edge termination and thermal oxide passivation techniques. The devices show a `hard' avalanche breakdown with a positive temperature coefficient, a wide spectral range (285 nm to 360 nm) with higher than 100 A/W photoresponsivity, and a peak photoresponsivity of 738 A/W at 320 nm. The visible-blind rejection ratio, defined as the maximum responsivity divided by the responsivity at 400 nm, has a maximum value of about 2500 at 93.9 V reverse bias. The APD photoresponse speed is studied and a fall time of 4.0 ns is measured.
Original language | English (US) |
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Pages (from-to) | II/- |
Journal | Materials Science Forum |
Volume | 338 |
State | Published - 2000 |
Event | ICSCRM '99: The International Conference on Silicon Carbide and Related Materials - Research Triangle Park, NC, USA Duration: Oct 10 1999 → Oct 15 1999 |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering