Dielectric functions and critical points of BexZn1-xTe alloys measured by spectroscopic ellipsometry

M. R. Buckley; F. C. Peiris; O. Maksimov; M. Muñoz; M. C. Tamargo

doi:10.1063/1.1534387

Dielectric functions and critical points of Be_xZn_1-xTe alloys measured by spectroscopic ellipsometry

M. R. Buckley, F. C. Peiris, O. Maksimov, M. Muñoz, M. C. Tamargo

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Abstract

The complex dielectric function of a series of ternary Be_xZn_1-xTe thin films for alloy concentrations between x=0.0 and x=0.52 was investigated using a rotating analyzer spectroscopic ellipsometer. A standard inversion technique was used to obtain the optical constants from the measured ellipsometric spectra. The results showed that the energy of the critical points with respect to Be concentration does not show any bowing effects unlike many other II-VI semiconductor ternary alloys.

Original language	English (US)
Pages (from-to)	5156-5158
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	27
DOIs	https://doi.org/10.1063/1.1534387
State	Published - Dec 30 2002
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1534387

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abstract = "The complex dielectric function of a series of ternary BexZn1-xTe thin films for alloy concentrations between x=0.0 and x=0.52 was investigated using a rotating analyzer spectroscopic ellipsometer. A standard inversion technique was used to obtain the optical constants from the measured ellipsometric spectra. The results showed that the energy of the critical points with respect to Be concentration does not show any bowing effects unlike many other II-VI semiconductor ternary alloys.",

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T1 - Dielectric functions and critical points of BexZn1-xTe alloys measured by spectroscopic ellipsometry

AU - Buckley, M. R.

AU - Peiris, F. C.

AU - Maksimov, O.

AU - Muñoz, M.

AU - Tamargo, M. C.

PY - 2002/12/30

Y1 - 2002/12/30

N2 - The complex dielectric function of a series of ternary BexZn1-xTe thin films for alloy concentrations between x=0.0 and x=0.52 was investigated using a rotating analyzer spectroscopic ellipsometer. A standard inversion technique was used to obtain the optical constants from the measured ellipsometric spectra. The results showed that the energy of the critical points with respect to Be concentration does not show any bowing effects unlike many other II-VI semiconductor ternary alloys.

AB - The complex dielectric function of a series of ternary BexZn1-xTe thin films for alloy concentrations between x=0.0 and x=0.52 was investigated using a rotating analyzer spectroscopic ellipsometer. A standard inversion technique was used to obtain the optical constants from the measured ellipsometric spectra. The results showed that the energy of the critical points with respect to Be concentration does not show any bowing effects unlike many other II-VI semiconductor ternary alloys.

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JO - Applied Physics Letters

JF - Applied Physics Letters

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Dielectric functions and critical points of Be_xZn_1-xTe alloys measured by spectroscopic ellipsometry

Abstract

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