Abstract
This work investigates the effects of anisotropic epitaxial strains on the microwave frequency dielectric response of BST (60/40) thin films. Dielectric properties such as permittivity and tunability along the 〈-110〉, 〈-111〉 and 〈001〉 cristallographic directions correlate well with the variation of elastic strain energy as a function of film thickness. We demonstrate unequivocally that the maximum permittivity and tunability is obtained along a crystallographic direction where the strain is a minimum.
Original language | English (US) |
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Pages | 47-50 |
Number of pages | 4 |
State | Published - 2005 |
Event | 2004 14th IEEE International Symposium on Applications of Ferroelectrics, ISAF-04. A Conference of the IEEE Ultrasonics, Feroelectrics, and Frequency Control Society (UFFC-S) - Montreal, Canada Duration: Aug 23 2004 → Aug 27 2004 |
Other
Other | 2004 14th IEEE International Symposium on Applications of Ferroelectrics, ISAF-04. A Conference of the IEEE Ultrasonics, Feroelectrics, and Frequency Control Society (UFFC-S) |
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Country/Territory | Canada |
City | Montreal |
Period | 8/23/04 → 8/27/04 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering