Dynamical mean-field studies of metal-insulator transitions

V. Dobrosavljević, G. Kotliar

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

We discuss the successes of the dynamical mean-field (DMF) approach to metal-insulator transitions in both the clean and the disordered limit. In the latter case, standard DMF equations are generalized in order to incorporate both the physics of strong correlation and Anderson localization effects. The results give new insights into the puzzling features of doped semiconductors.

Original languageEnglish (US)
Pages (from-to)57-74
Number of pages18
JournalPhilosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences
Volume356
Issue number1735
DOIs
StatePublished - Jan 15 1998

All Science Journal Classification (ASJC) codes

  • General Mathematics
  • General Engineering
  • General Physics and Astronomy

Keywords

  • Anderson localization
  • Disorder
  • Dynamical mean-field theory
  • Local magnetic moments
  • Metal-insulator transitions
  • Strong correlations

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