Effects of crystalline quality and electrode material on fatigue in Pb(Zr,Ti)O3 thin film capacitors

J. Lee; L. Johnson; A. Safari; R. Ramesh; T. Sands; H. Gilchrist; V. G. Keramidas

doi:10.1063/1.109739

Effects of crystalline quality and electrode material on fatigue in Pb(Zr,Ti)O₃ thin film capacitors

J. Lee, L. Johnson, A. Safari, R. Ramesh, T. Sands, H. Gilchrist, V. G. Keramidas

School of Engineering, Materials Science & Engineering

Research output: Contribution to journal › Article › peer-review

45 Scopus citations

Abstract

Pb(Zr_0.52Ti_0.48)O₃(PZT)/Y ₁Ba₂Cu₃O_x(YBCO) heterostructures have been grown by pulsed laser deposition, in which PZT films were epitaxial, highly oriented, or polycrystalline. These PZT films were obtained by varying the deposition temperature from 550 to 760°C or by using various substrates such as SrTiO₃(100), MgO(100), and r-plane sapphire. PZT films with Pt top electrodes exhibited large fatigue with 35%-50% loss of the remanent polarization after 10⁹ cycles, depending on the crystalline quality. Polycrystalline films showed better fatigue resistance than epitaxial or highly oriented films. However, PZT films with both top and bottom YBCO electrodes had significantly improved fatigue resistance for both epitaxial and polycrystalline films. Electrode material seems to be a more important parameter in fatigue than the crystalline quality of the PZT films.

Original language	English (US)
Pages (from-to)	27-29
Number of pages	3
Journal	Applied Physics Letters
Volume	63
Issue number	1
DOIs	https://doi.org/10.1063/1.109739
State	Published - 1993

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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title = "Effects of crystalline quality and electrode material on fatigue in Pb(Zr,Ti)O3 thin film capacitors",

abstract = "Pb(Zr0.52Ti0.48)O3(PZT)/Y 1Ba2Cu3Ox(YBCO) heterostructures have been grown by pulsed laser deposition, in which PZT films were epitaxial, highly oriented, or polycrystalline. These PZT films were obtained by varying the deposition temperature from 550 to 760°C or by using various substrates such as SrTiO3(100), MgO(100), and r-plane sapphire. PZT films with Pt top electrodes exhibited large fatigue with 35%-50% loss of the remanent polarization after 109 cycles, depending on the crystalline quality. Polycrystalline films showed better fatigue resistance than epitaxial or highly oriented films. However, PZT films with both top and bottom YBCO electrodes had significantly improved fatigue resistance for both epitaxial and polycrystalline films. Electrode material seems to be a more important parameter in fatigue than the crystalline quality of the PZT films.",

author = "J. Lee and L. Johnson and A. Safari and R. Ramesh and T. Sands and H. Gilchrist and Keramidas, {V. G.}",

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T1 - Effects of crystalline quality and electrode material on fatigue in Pb(Zr,Ti)O3 thin film capacitors

AU - Lee, J.

AU - Johnson, L.

AU - Safari, A.

AU - Ramesh, R.

AU - Sands, T.

AU - Gilchrist, H.

AU - Keramidas, V. G.

PY - 1993

Y1 - 1993

N2 - Pb(Zr0.52Ti0.48)O3(PZT)/Y 1Ba2Cu3Ox(YBCO) heterostructures have been grown by pulsed laser deposition, in which PZT films were epitaxial, highly oriented, or polycrystalline. These PZT films were obtained by varying the deposition temperature from 550 to 760°C or by using various substrates such as SrTiO3(100), MgO(100), and r-plane sapphire. PZT films with Pt top electrodes exhibited large fatigue with 35%-50% loss of the remanent polarization after 109 cycles, depending on the crystalline quality. Polycrystalline films showed better fatigue resistance than epitaxial or highly oriented films. However, PZT films with both top and bottom YBCO electrodes had significantly improved fatigue resistance for both epitaxial and polycrystalline films. Electrode material seems to be a more important parameter in fatigue than the crystalline quality of the PZT films.

AB - Pb(Zr0.52Ti0.48)O3(PZT)/Y 1Ba2Cu3Ox(YBCO) heterostructures have been grown by pulsed laser deposition, in which PZT films were epitaxial, highly oriented, or polycrystalline. These PZT films were obtained by varying the deposition temperature from 550 to 760°C or by using various substrates such as SrTiO3(100), MgO(100), and r-plane sapphire. PZT films with Pt top electrodes exhibited large fatigue with 35%-50% loss of the remanent polarization after 109 cycles, depending on the crystalline quality. Polycrystalline films showed better fatigue resistance than epitaxial or highly oriented films. However, PZT films with both top and bottom YBCO electrodes had significantly improved fatigue resistance for both epitaxial and polycrystalline films. Electrode material seems to be a more important parameter in fatigue than the crystalline quality of the PZT films.

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Effects of crystalline quality and electrode material on fatigue in Pb(Zr,Ti)O₃ thin film capacitors

Abstract

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