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Effects of scaling thickness and niobium doping level on ferroelectric thin film capacitor memory operation
Francis K. Chai, R. D. Schrimpf, J. R. Brews, D. P. Birnie, K. F. Galloway, R. N. Vogt, M. N. Orr
Research output: Contribution to journal › Conference article › peer-review
3
Scopus
citations