Electronic structure of the 1D conductor K0.3MoO3 studied using resonant inelastic x-ray scattering and soft x-ray emission spectroscopy

T. Learmonth, P. A. Glans, C. McGuinness, L. Plucinski, Y. Zhang, J. H. Guo, M. Greenblatt, K. E. Smith

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Abstract

The electronic structure of the quasi-one-dimensional conductor K 0.3MoO3 has been measured using high resolution resonant inelastic x-ray scattering and x-ray absorption spectroscopy. The results are compared to those for the related two-dimensional insulator α-MoO 3. Features of the scattering from both oxides are observed and are explained in terms of the band momentum selectivity of the scattering process, allowing a comparison of the scattering data with recent band structure calculations.

Original languageEnglish (US)
Article number415219
JournalJournal of Physics Condensed Matter
Volume20
Issue number41
DOIs
StatePublished - Oct 15 2008

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics

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