Enhanced sensitivity to oxide surface defects using Augerphotoelectron coincidence spectroscopy

A. K. See, W. K. Siu, R. A. Bartynski, A. Nangia, A. H. Weiss, S. L. Hulbert, X. Wu, C. C. Kao

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We present Auger-photoelectron coincidence (APECS) spectra of the Ti 3p core level obtained in coincidence with Ti M2,3VV Auger electrons from the stoichiometric and vacuum annealed TiO2(110) surfaces. For both surfaces, emission corresponding to reduced oxidation states has approximately an order of magnitude greater relative intensity in the coincidence spectrum as compared with the corresponding ordinary (singles) photoemission spectrum. We associate the excess coincidence signal from the stoichiometric surface with previously undetected residual defects. The origins and implications of the enhanced sensitivity of APECS to defects at oxide surfaces is discussed.

Original languageEnglish (US)
Pages (from-to)L735-L741
JournalSurface Science
Volume383
Issue number2-3
DOIs
StatePublished - Jul 10 1997

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Keywords

  • Auger ejection
  • Auger electron spectroscopy
  • Photoelectron emission
  • Surface defects
  • Titanium oxide

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