Erratum: "Theoretical and experimental determination of deep trap profiles in semiconductors" (Journal of Applied Physics (1987) 61 (1063)]

Jian H. Zhao, Jyh Chwen Lee, Z. Q. Fang, T. E. Schlesinger, A. G. Milnes

Research output: Contribution to journalComment/debate

1 Citation (Scopus)
Original languageEnglish (US)
Number of pages1
JournalJournal of Applied Physics
Volume61
Issue number12
DOIs
StatePublished - Dec 1 1987
Externally publishedYes

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traps
physics
profiles

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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title = "Erratum: {"}Theoretical and experimental determination of deep trap profiles in semiconductors{"} (Journal of Applied Physics (1987) 61 (1063)]",
author = "Zhao, {Jian H.} and Lee, {Jyh Chwen} and Fang, {Z. Q.} and Schlesinger, {T. E.} and Milnes, {A. G.}",
year = "1987",
month = "12",
day = "1",
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language = "English (US)",
volume = "61",
journal = "Journal of Applied Physics",
issn = "0021-8979",
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}

Erratum : "Theoretical and experimental determination of deep trap profiles in semiconductors" (Journal of Applied Physics (1987) 61 (1063)]. / Zhao, Jian H.; Lee, Jyh Chwen; Fang, Z. Q.; Schlesinger, T. E.; Milnes, A. G.

In: Journal of Applied Physics, Vol. 61, No. 12, 01.12.1987.

Research output: Contribution to journalComment/debate

TY - JOUR

T1 - Erratum

T2 - "Theoretical and experimental determination of deep trap profiles in semiconductors" (Journal of Applied Physics (1987) 61 (1063)]

AU - Zhao, Jian H.

AU - Lee, Jyh Chwen

AU - Fang, Z. Q.

AU - Schlesinger, T. E.

AU - Milnes, A. G.

PY - 1987/12/1

Y1 - 1987/12/1

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U2 - 10.1063/1.338980

DO - 10.1063/1.338980

M3 - Comment/debate

AN - SCOPUS:36549095584

VL - 61

JO - Journal of Applied Physics

JF - Journal of Applied Physics

SN - 0021-8979

IS - 12

ER -