Experience with the IBM sub-angstrom STEM

Research output: Contribution to journalArticle

1 Citation (Scopus)
Original languageEnglish (US)
Pages (from-to)136-137
Number of pages2
JournalMicroscopy and Microanalysis
Volume9
Issue numberSUPPL. 2
StatePublished - Sep 4 2003

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

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author = "Philip Batson",
year = "2003",
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language = "English (US)",
volume = "9",
pages = "136--137",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

Experience with the IBM sub-angstrom STEM. / Batson, Philip.

In: Microscopy and Microanalysis, Vol. 9, No. SUPPL. 2, 04.09.2003, p. 136-137.

Research output: Contribution to journalArticle

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