We have constructed monolithic masks for proximity x-ray lithography by forming 1 μm thick polycrystalline Si membranes directly on glass support frames. Finished masks are 78 mm in diameter and ∼5 mm thick, with the Si membrane spanning 27 mm. The monolithic design provides simple processing and unprecedented flatness of 30 nm across the membrane and <500 nm across the entire disk. Mask blanks were metallized with 500 nm of W that was sputter deposited under conditions that hold the film stress <50 MPa. Tungsten was patterned by reactive ion etching to form features as small as 0.25 μm.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - 1991|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)