FRET efficiency measurement with a low-cost frequency domain fluorescence lifetime imaging microscope

John Paul Dumas, James Y. Jiang, Evan M. Gates, Brenton D. Hoffman, Mark C. Pierce, Nada N. Boustany

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We utilize a frequency-domain FLIM system operating at a single modulation frequency in combination with a FRET standards calibration curve to measure the FRET efficiency of the vinculin tension sensor, VinTS, at the focal adhesions of living cells.

Original languageEnglish (US)
Title of host publicationMicroscopy Histopathology and Analytics, Microscopy 2020
PublisherOSA - The Optical Society
ISBN (Electronic)9781557528209
DOIs
StatePublished - 2020
EventMicroscopy Histopathology and Analytics, Microscopy 2020 - Washington, United States
Duration: Apr 20 2020Apr 23 2020

Publication series

NameOptics InfoBase Conference Papers
VolumePart F177-Microscopy-2020

Conference

ConferenceMicroscopy Histopathology and Analytics, Microscopy 2020
Country/TerritoryUnited States
City Washington
Period4/20/204/23/20

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Electronic, Optical and Magnetic Materials

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