Helium diffraction from (2 × n) structures on Si(001)

DM Rohlfing, J. Ellis, BJ Hinch, W. Allison, RF Willis

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


Results of helium diffraction from Si(001)-(2 × n), n ≈ 10 are presented. The (2 × n) unit cells are shown to contain missing dimer defects alongside dimerized surface atoms. The experimental distribution of scattered intensity is compared with current models of the silicon dimer geometry and it is shown that all the main features in the observed spectra can be explained with a symmetric dimer configuration.

Original languageEnglish (US)
Pages (from-to)287-289
Number of pages3
Issue number4-5
StatePublished - Jan 1 1988
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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