High frequency ultrasound phased array characterization of SiC mirror blanks

Richard Haber, Andrew Portune

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Silicon carbide mirror blank materials were characterized using ultrasound phased array technology to determine the feasibility of using this method for rapidly characterizing material homogeneity and locate anomalous flaws. A 10MHz 64 element linear probe was used to measure and image the top and bottom surface reflected signal peak amplitudes. C-scan images located the presence of possible sub-surface heterogeneities as well as surface scratches invisible to the eye. Bottom surface scans located variations in homogeneity within the sample bulk. High frequency ultrasound phased array was found to be well suited for detailed characterization of SiC mirror blanks.

Original languageEnglish (US)
Title of host publicationOptical Materials and Structures Technologies IV
DOIs
StatePublished - Oct 19 2009
EventOptical Materials and Structures Technologies IV - San Diego, CA, United States
Duration: Aug 2 2009Aug 3 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7425
ISSN (Print)0277-786X

Other

OtherOptical Materials and Structures Technologies IV
CountryUnited States
CitySan Diego, CA
Period8/2/098/3/09

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Haber, R., & Portune, A. (2009). High frequency ultrasound phased array characterization of SiC mirror blanks. In Optical Materials and Structures Technologies IV [742508] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7425). https://doi.org/10.1117/12.825096