High speed force-volume mapping using atomic force microscope

Kyong Soo Kim, Haiming Wang, Qingze Zou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


This article proposes a control approach based on the notion of superimposition and iterative learning control to achieve high-speed force-volume mapping on scanning probe microscope (SPM). Current forcevolume mapping measurement is slow, resulting in large temporal errors in the force mapping when rapid dynamic evolution is involved in the sample. The force-volume mapping speed is limited by the challenge to overcome the hardware adverse effects excited during high-speed mapping, particularly over a relatively large sample area. The contribution of this article is the development of a novel control approach to high-speed force-volume mapping. The proposed approach utilizes the concept of signal decoupling-superimposition and the recentlydeveloped model-less inversion-based iterative control (MIIC) technique. Experiment on force-curve mapping of a Polydimethylsiloxane (PDMS) sample is presented to illustrate the proposed approach. The experimental results show that the mapping speed can be increased by over 20 times.

Original languageEnglish (US)
Title of host publication2009 American Control Conference, ACC 2009
Number of pages6
StatePublished - 2009
Externally publishedYes
Event2009 American Control Conference, ACC 2009 - St. Louis, MO, United States
Duration: Jun 10 2009Jun 12 2009

Publication series

NameProceedings of the American Control Conference
ISSN (Print)0743-1619


Other2009 American Control Conference, ACC 2009
Country/TerritoryUnited States
CitySt. Louis, MO

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


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