Influences of post-annealing on structural, morphological and electrical properties of Cd                         1−x                         Mn                         x                         Te films

Huanhuan Ji; Jian Huang; Lin Wang; Junnan Wang; Jianming Lai; Run Xu; Jijun Zhang; Yue Shen; Jiahua Min; Linjun Wang; Yicheng Lu

doi:10.1016/j.apsusc.2015.11.237

Influences of post-annealing on structural, morphological and electrical properties of Cd _1−x Mn _x Te films

Huanhuan Ji, Jian Huang, Lin Wang, Junnan Wang, Jianming Lai, Run Xu, Jijun Zhang, Yue Shen, Jiahua Min, Linjun Wang, Yicheng Lu

School of Engineering, Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

Cd _1−x Mn _x Te films were grown on SnO ₂ :F (FTO)-coated glass substrates by close-spaced sublimation method. After deposition, the films were etched by Br-MeOH (BM) solution followed by two separate annealing processes. One was only carried out in N ₂ directly, and the other was further annealed in MnCl ₂ . XRD, SEM, EDS and I–V measurement were employed to investigate the influences of post-annealing on the structure and properties of Cd _1−x Mn _x Te films. Uniform Cd _1−x Mn _x Te films with high quality and high resistivity were obtained by BM/N ₂ post-treatment.

Original language	English (US)
Pages (from-to)	444-447
Number of pages	4
Journal	Applied Surface Science
Volume	388
DOIs	https://doi.org/10.1016/j.apsusc.2015.11.237
State	Published - Dec 1 2016

All Science Journal Classification (ASJC) codes

Chemistry(all)
Condensed Matter Physics
Physics and Astronomy(all)
Surfaces and Interfaces
Surfaces, Coatings and Films

Keywords

CSS
Cd Mn Te films
Post-treatment
Properties
Structure

Access to Document

10.1016/j.apsusc.2015.11.237

Cite this

Ji, H., Huang, J., Wang, L., Wang, J., Lai, J., Xu, R., Zhang, J., Shen, Y., Min, J., Wang, L., & Lu, Y. (2016). Influences of post-annealing on structural, morphological and electrical properties of Cd _1−x Mn _x Te films Applied Surface Science, 388, 444-447. https://doi.org/10.1016/j.apsusc.2015.11.237

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title = " Influences of post-annealing on structural, morphological and electrical properties of Cd 1−x Mn x Te films ",

abstract = " Cd 1−x Mn x Te films were grown on SnO 2 :F (FTO)-coated glass substrates by close-spaced sublimation method. After deposition, the films were etched by Br-MeOH (BM) solution followed by two separate annealing processes. One was only carried out in N 2 directly, and the other was further annealed in MnCl 2 . XRD, SEM, EDS and I–V measurement were employed to investigate the influences of post-annealing on the structure and properties of Cd 1−x Mn x Te films. Uniform Cd 1−x Mn x Te films with high quality and high resistivity were obtained by BM/N 2 post-treatment.",

keywords = "CSS, Cd Mn Te films, Post-treatment, Properties, Structure",

author = "Huanhuan Ji and Jian Huang and Lin Wang and Junnan Wang and Jianming Lai and Run Xu and Jijun Zhang and Yue Shen and Jiahua Min and Linjun Wang and Yicheng Lu",

note = "Funding Information: This work was supported by National Natural Science Foundation of China (11304193, 11375112). Publisher Copyright: {\textcopyright} 2015 Elsevier B.V.",

year = "2016",

month = dec,

day = "1",

doi = "10.1016/j.apsusc.2015.11.237",

language = "English (US)",

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Ji, H, Huang, J, Wang, L, Wang, J, Lai, J, Xu, R, Zhang, J, Shen, Y, Min, J, Wang, L & Lu, Y 2016, ' Influences of post-annealing on structural, morphological and electrical properties of Cd _1−x Mn _x Te films ', Applied Surface Science, vol. 388, pp. 444-447. https://doi.org/10.1016/j.apsusc.2015.11.237

Influences of post-annealing on structural, morphological and electrical properties of Cd _1−x Mn _x Te films . / Ji, Huanhuan; Huang, Jian; Wang, Lin et al.

In: Applied Surface Science, Vol. 388, 01.12.2016, p. 444-447.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Influences of post-annealing on structural, morphological and electrical properties of Cd 1−x Mn x Te films

AU - Ji, Huanhuan

AU - Huang, Jian

AU - Wang, Lin

AU - Wang, Junnan

AU - Lai, Jianming

AU - Xu, Run

AU - Zhang, Jijun

AU - Shen, Yue

AU - Min, Jiahua

AU - Wang, Linjun

AU - Lu, Yicheng

PY - 2016/12/1

Y1 - 2016/12/1

N2 - Cd 1−x Mn x Te films were grown on SnO 2 :F (FTO)-coated glass substrates by close-spaced sublimation method. After deposition, the films were etched by Br-MeOH (BM) solution followed by two separate annealing processes. One was only carried out in N 2 directly, and the other was further annealed in MnCl 2 . XRD, SEM, EDS and I–V measurement were employed to investigate the influences of post-annealing on the structure and properties of Cd 1−x Mn x Te films. Uniform Cd 1−x Mn x Te films with high quality and high resistivity were obtained by BM/N 2 post-treatment.

AB - Cd 1−x Mn x Te films were grown on SnO 2 :F (FTO)-coated glass substrates by close-spaced sublimation method. After deposition, the films were etched by Br-MeOH (BM) solution followed by two separate annealing processes. One was only carried out in N 2 directly, and the other was further annealed in MnCl 2 . XRD, SEM, EDS and I–V measurement were employed to investigate the influences of post-annealing on the structure and properties of Cd 1−x Mn x Te films. Uniform Cd 1−x Mn x Te films with high quality and high resistivity were obtained by BM/N 2 post-treatment.

KW - CSS

KW - Cd Mn Te films

KW - Post-treatment

KW - Properties

KW - Structure

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Ji H, Huang J, Wang L, Wang J, Lai J, Xu R et al. Influences of post-annealing on structural, morphological and electrical properties of Cd _1−x Mn _x Te films Applied Surface Science. 2016 Dec 1;388:444-447. doi: 10.1016/j.apsusc.2015.11.237