Using single-crystal organic field-effect transistors with the conduction channel exposed to environmental agents, we have observed generation of electronic defects at the organic surface in the high-vacuum environment. Rapid decrease of the source-drain current of an operating device is observed upon exposure of the channel to the species generated by high-vacuum gauges. We attribute this effect to interaction of the organic surface with electrically neutral free radicals produced in the process of hydrocarbon cracking on hot filaments with a relatively low activation energy Ea ∼2.5 eV (240 kJmol). The reported results might be important for optimizing the high-vacuum processes of fabrication and characterization of a wide range of organic and molecular electronic devices.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)