Inverse Scattering Problems for Imperfect Conductors

Fioralba Cakoni, David Colton

Research output: Chapter in Book/Report/Conference proceedingChapter


We are now in a position to introduce the inverse scattering problem for an imperfect conductor, in particular given the far-field pattern of the scattered field to determine the support of the scattering object D and the surface impedance λ. Our approach to this problem is based on the linear sampling method in inverse scattering theory that was first introduced by Colton and Kirsch [50] and Colton et al. [61].

Original languageEnglish (US)
Title of host publicationApplied Mathematical Sciences (Switzerland)
Number of pages21
StatePublished - Jan 1 2014
Externally publishedYes

Publication series

NameApplied Mathematical Sciences (Switzerland)
ISSN (Print)0066-5452
ISSN (Electronic)2196-968X

All Science Journal Classification (ASJC) codes

  • Applied Mathematics


Dive into the research topics of 'Inverse Scattering Problems for Imperfect Conductors'. Together they form a unique fingerprint.

Cite this