We are now in a position to introduce the inverse scattering problem for an imperfect conductor, in particular given the far-field pattern of the scattered field to determine the support of the scattering object D and the surface impedance λ. Our approach to this problem is based on the linear sampling method in inverse scattering theory that was first introduced by Colton and Kirsch  and Colton et al. .
|Original language||English (US)|
|Title of host publication||Applied Mathematical Sciences (Switzerland)|
|Number of pages||21|
|State||Published - Jan 1 2014|
|Name||Applied Mathematical Sciences (Switzerland)|
All Science Journal Classification (ASJC) codes
- Applied Mathematics