Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging

Akshay Agarwal; Leila Kasaei; Xinglin He; Ruangrawee Kitichotkul; Oguz Kagan Hitit; J. Albert Schultz; Leonard C. Feldman; Vivek Goyal

doi:10.1093/mam/ozae044.987

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging

Akshay Agarwal, Leila Kasaei, Xinglin He, Ruangrawee Kitichotkul, Oguz Kagan Hitit, J. Albert Schultz, Leonard C. Feldman, Vivek Goyal

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1994-1995
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
DOIs	https://doi.org/10.1093/mam/ozae044.987
State	Published - Jul 1 2024
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1093/mam/ozae044.987

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title = "Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging",

author = "Akshay Agarwal and Leila Kasaei and Xinglin He and Ruangrawee Kitichotkul and Hitit, {Oguz Kagan} and Schultz, {J. Albert} and Feldman, {Leonard C.} and Vivek Goyal",

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doi = "10.1093/mam/ozae044.987",

language = "English (US)",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

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TY - JOUR

T1 - Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging

AU - Agarwal, Akshay

AU - Kasaei, Leila

AU - He, Xinglin

AU - Kitichotkul, Ruangrawee

AU - Hitit, Oguz Kagan

AU - Schultz, J. Albert

AU - Feldman, Leonard C.

AU - Goyal, Vivek

PY - 2024/7/1

Y1 - 2024/7/1

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U2 - 10.1093/mam/ozae044.987

DO - 10.1093/mam/ozae044.987

M3 - Article

AN - SCOPUS:85199697981

SN - 1431-9276

VL - 30

SP - 1994

EP - 1995

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mitigated Secondary Electron Imaging

All Science Journal Classification (ASJC) codes

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