Abstract
135 nsec pulses of λ = 1.06 μm light from a Nd: YAG laser have been used to form Schottky barriers by irradiation of a 500Å thick metal film on n-type silicon. Large area barriers were fabricated by over-lapping individual 30 μ diameter laser pulses of from 4 to 12 J/cm2. The barrier height was 0.73 ± 0.03 V, independent of the laser power. The barrier quality, as assessed by measurement of the forward current characteristic, decreased with laser power to a value of n = 1.5 at 12 J/cm2.
Original language | English (US) |
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Pages (from-to) | 453-458 |
Number of pages | 6 |
Journal | Journal of Electronic Materials |
Volume | 9 |
Issue number | 2 |
DOIs | |
State | Published - Mar 1980 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
Keywords
- Laser annealing
- Pt-Si
- Schottky barriers