Mapping and load response of overload strain fields: Synchrotron X-ray measurements

Mark Croft, V. Shukla, N. M. Jisrawi, Z. Zhong, R. K. Sadangi, R. L. Holtz, P. S. Pao, K. Horvath, K. Sadananda, A. Ignatov, J. Skaritka, Thomas Tsakalakos

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

High energy synchrotron X-ray diffraction measurements have been performed to provide quantitative microscopic guidance for modeling of fatigue crack growth. Specifically we report local strain mapping, along with in situ loading strain response, results on 4140 steel fatigue specimens exhibiting the crack growth retardation "overload effect". Detailed, 2D, εyy-strain field mapping shows that a single overload (OL) cycle creates a compressive strain field extending millimeters above and below the crack plane. The OL strain field structures are shown to persist after the crack tip has grown well beyond the OL position. The specimen exhibiting the maximal crack growth rate retardation following overload exhibits a tensile residual strain region at the crack tip. Strain field results, on in situ tensile loaded specimens, show a striking critical threshold load, Fc, phenomenon in their strain response. At loads below Fc the strain response is dominated by a rapid suppression of the compressive OL feature with modest response at the crack tip. At loads above Fc the strain response at the OL position terminates and the response at the crack tip becomes large. This threshold load response behavior is shown to exhibit lower Fc values, and dramatically enhanced rates of strain change with load as the crack tip propagates farther beyond the OL position. The OL strain feature behind the crack tip also is shown to be suppressed by removing the opposing crack faces via an electron discharge cut passing through the crack tip. Finally unique 2D strain field mapping (imaging) results, through the depth of the specimen, of the fatigue crack front and the OL feature in the wake are also presented.

Original languageEnglish (US)
Pages (from-to)1669-1677
Number of pages9
JournalInternational Journal of Fatigue
Volume31
Issue number11-12
DOIs
StatePublished - Nov 2009

All Science Journal Classification (ASJC) codes

  • Modeling and Simulation
  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

Keywords

  • Fatigue
  • Overload
  • Strain
  • Synchrotron
  • X-ray

Fingerprint Dive into the research topics of 'Mapping and load response of overload strain fields: Synchrotron X-ray measurements'. Together they form a unique fingerprint.

Cite this