Measurement of the temperature field at the tool-chip interface in machining

V. Narayanan; K. Krishnamurthy; S. Chandrasekar; T. N. Farris; V. Madhavan

Measurement of the temperature field at the tool-chip interface in machining

V. Narayanan, K. Krishnamurthy, S. Chandrasekar, T. N. Farris, V. Madhavan

Research output: Contribution to conference › Paper › peer-review

Abstract

The measurement of the temperature field at the tool-chip interface in machining has been demonstrated. The key elements in the measurement technique are the use of an optically transparent sapphire tool, which has enabled direct images of the tool-chip contact area in the infra-red to be obtained at high spatial and temporal resolution; and radiation intensity measurements in two wavelength windows which have enabled the temperature field to be accurately derived from these intensity values. The principal characteristics of the temperature field such as the variation of temperature with position along the interface and the location of the region of highest temperature are identified. The implications of this measurement to our understanding of the tribology of the tool-chip interface and machining process models are briefly discussed.

Original language	English (US)
Pages	89-96
Number of pages	8
State	Published - 2001
Externally published	Yes
Event	2001 ASME International Mechanical Engineering Congress and Exposition - New York, NY, United States Duration: Nov 11 2001 → Nov 16 2001

Other

Other	2001 ASME International Mechanical Engineering Congress and Exposition
Country/Territory	United States
City	New York, NY
Period	11/11/01 → 11/16/01

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

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title = "Measurement of the temperature field at the tool-chip interface in machining",

abstract = "The measurement of the temperature field at the tool-chip interface in machining has been demonstrated. The key elements in the measurement technique are the use of an optically transparent sapphire tool, which has enabled direct images of the tool-chip contact area in the infra-red to be obtained at high spatial and temporal resolution; and radiation intensity measurements in two wavelength windows which have enabled the temperature field to be accurately derived from these intensity values. The principal characteristics of the temperature field such as the variation of temperature with position along the interface and the location of the region of highest temperature are identified. The implications of this measurement to our understanding of the tribology of the tool-chip interface and machining process models are briefly discussed.",

author = "V. Narayanan and K. Krishnamurthy and S. Chandrasekar and Farris, {T. N.} and V. Madhavan",

year = "2001",

language = "English (US)",

pages = "89--96",

note = "2001 ASME International Mechanical Engineering Congress and Exposition ; Conference date: 11-11-2001 Through 16-11-2001",

}

TY - CONF

T1 - Measurement of the temperature field at the tool-chip interface in machining

AU - Narayanan, V.

AU - Krishnamurthy, K.

AU - Chandrasekar, S.

AU - Farris, T. N.

AU - Madhavan, V.

PY - 2001

Y1 - 2001

N2 - The measurement of the temperature field at the tool-chip interface in machining has been demonstrated. The key elements in the measurement technique are the use of an optically transparent sapphire tool, which has enabled direct images of the tool-chip contact area in the infra-red to be obtained at high spatial and temporal resolution; and radiation intensity measurements in two wavelength windows which have enabled the temperature field to be accurately derived from these intensity values. The principal characteristics of the temperature field such as the variation of temperature with position along the interface and the location of the region of highest temperature are identified. The implications of this measurement to our understanding of the tribology of the tool-chip interface and machining process models are briefly discussed.

AB - The measurement of the temperature field at the tool-chip interface in machining has been demonstrated. The key elements in the measurement technique are the use of an optically transparent sapphire tool, which has enabled direct images of the tool-chip contact area in the infra-red to be obtained at high spatial and temporal resolution; and radiation intensity measurements in two wavelength windows which have enabled the temperature field to be accurately derived from these intensity values. The principal characteristics of the temperature field such as the variation of temperature with position along the interface and the location of the region of highest temperature are identified. The implications of this measurement to our understanding of the tribology of the tool-chip interface and machining process models are briefly discussed.

UR - http://www.scopus.com/inward/record.url?scp=0242694867&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0242694867&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0242694867

SP - 89

EP - 96

T2 - 2001 ASME International Mechanical Engineering Congress and Exposition

Y2 - 11 November 2001 through 16 November 2001

ER -

Measurement of the temperature field at the tool-chip interface in machining

Abstract

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All Science Journal Classification (ASJC) codes

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