Measuring the infrared absorption in thin film coatings

James Harrington, Morris Braunstein, J. Earl Rudisill

Research output: Contribution to journalArticle

12 Scopus citations


Traditionally, the optical absorption in thin dielectric films has been obtained by comparing the absorption in coated and uncoated substrates. A new technique has been developed in which the absorption of the film is obtained directly without resorting to comparison or difference methods. This method relies on the separation of surface and bulk heat that results from laser calorimetric measurements on long, bar-shaped samples. Single layer films of As2S3, CaF2, ThF4, and PbF2 were deposited on a KCl bar, and the absorption coefficient of each film was extracted from the slopes of the temperature–time curves.

Original languageEnglish (US)
Pages (from-to)2843-2846
Number of pages4
JournalApplied Optics
Issue number11
StatePublished - Jan 1 1977

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Measuring the infrared absorption in thin film coatings'. Together they form a unique fingerprint.

  • Cite this

    Harrington, J., Braunstein, M., & Rudisill, J. E. (1977). Measuring the infrared absorption in thin film coatings. Applied Optics, 16(11), 2843-2846.