Measuring the infrared absorption in thin film coatings

James Harrington, Morris Braunstein, J. Earl Rudisill

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Abstract

Traditionally, the optical absorption in thin dielectric films has been obtained by comparing the absorption in coated and uncoated substrates. A new technique has been developed in which the absorption of the film is obtained directly without resorting to comparison or difference methods. This method relies on the separation of surface and bulk heat that results from laser calorimetric measurements on long, bar-shaped samples. Single layer films of As2S3, CaF2, ThF4, and PbF2 were deposited on a KCl bar, and the absorption coefficient of each film was extracted from the slopes of the temperature–time curves.

Original languageEnglish (US)
Pages (from-to)2843-2846
Number of pages4
JournalApplied Optics
Volume16
Issue number11
DOIs
StatePublished - Jan 1 1977

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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    Harrington, J., Braunstein, M., & Rudisill, J. E. (1977). Measuring the infrared absorption in thin film coatings. Applied Optics, 16(11), 2843-2846. https://doi.org/10.1364/AO.16.002843