Mg composition dependent strain analysis in nonpolar a-plane Mg xZn1-xO films

G. Saraf; Y. Lu; T. Siegrist

doi:10.1063/1.3000636

Mg composition dependent strain analysis in nonpolar a-plane Mg _xZn_1-xO films

G. Saraf, Y. Lu, T. Siegrist

School of Engineering, Electrical & Computer Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Nonpolar a -plane (11 2- 0) Mgx Zn1-x O (a- Mgx Zn1-x O) films are deposited on (01 1- 2) r -sapphire substrates using metalorganic chemical vapor deposition with varying Mg composition (x from 0 to 0.25). Unit cell parameters with Mg composition are determined by high-resolution triple-axis x-ray diffraction. In-plane strain along the c -axis [0001] and m -axis [1 1- 00] in the films is anisotropic and increases with increasing Mg composition. The in-plane strain anisotropy changes with Mg composition in a- Mgx Zn1-x O. Calculations are carried out to determine the influence of Mg content on the residual interfacial strain.

Original language	English (US)
Article number	151907
Journal	Applied Physics Letters
Volume	93
Issue number	15
DOIs	https://doi.org/10.1063/1.3000636
State	Published - 2008

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.3000636

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title = "Mg composition dependent strain analysis in nonpolar a-plane Mg xZn1-xO films",

abstract = "Nonpolar a -plane (11 2- 0) Mgx Zn1-x O (a- Mgx Zn1-x O) films are deposited on (01 1- 2) r -sapphire substrates using metalorganic chemical vapor deposition with varying Mg composition (x from 0 to 0.25). Unit cell parameters with Mg composition are determined by high-resolution triple-axis x-ray diffraction. In-plane strain along the c -axis [0001] and m -axis [1 1- 00] in the films is anisotropic and increases with increasing Mg composition. The in-plane strain anisotropy changes with Mg composition in a- Mgx Zn1-x O. Calculations are carried out to determine the influence of Mg content on the residual interfacial strain.",

author = "G. Saraf and Y. Lu and T. Siegrist",

note = "Funding Information: This work has been supported by New Jersey Commission on Science and Technology (NJCST) and by Rutgers University{\textquoteright}s Academic Excellence Funds. We acknowledge the support of E. Demasi at NSLS in carrying out the synchrotron diffraction experiments.",

year = "2008",

doi = "10.1063/1.3000636",

language = "English (US)",

volume = "93",

journal = "Applied Physics Letters",

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publisher = "American Institute of Physics Publising LLC",

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T1 - Mg composition dependent strain analysis in nonpolar a-plane Mg xZn1-xO films

AU - Saraf, G.

AU - Lu, Y.

AU - Siegrist, T.

N1 - Funding Information: This work has been supported by New Jersey Commission on Science and Technology (NJCST) and by Rutgers University’s Academic Excellence Funds. We acknowledge the support of E. Demasi at NSLS in carrying out the synchrotron diffraction experiments.

PY - 2008

Y1 - 2008

N2 - Nonpolar a -plane (11 2- 0) Mgx Zn1-x O (a- Mgx Zn1-x O) films are deposited on (01 1- 2) r -sapphire substrates using metalorganic chemical vapor deposition with varying Mg composition (x from 0 to 0.25). Unit cell parameters with Mg composition are determined by high-resolution triple-axis x-ray diffraction. In-plane strain along the c -axis [0001] and m -axis [1 1- 00] in the films is anisotropic and increases with increasing Mg composition. The in-plane strain anisotropy changes with Mg composition in a- Mgx Zn1-x O. Calculations are carried out to determine the influence of Mg content on the residual interfacial strain.

AB - Nonpolar a -plane (11 2- 0) Mgx Zn1-x O (a- Mgx Zn1-x O) films are deposited on (01 1- 2) r -sapphire substrates using metalorganic chemical vapor deposition with varying Mg composition (x from 0 to 0.25). Unit cell parameters with Mg composition are determined by high-resolution triple-axis x-ray diffraction. In-plane strain along the c -axis [0001] and m -axis [1 1- 00] in the films is anisotropic and increases with increasing Mg composition. The in-plane strain anisotropy changes with Mg composition in a- Mgx Zn1-x O. Calculations are carried out to determine the influence of Mg content on the residual interfacial strain.

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Mg composition dependent strain analysis in nonpolar a-plane Mg _xZn_1-xO films

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