Mode imaging and dispersion analysis in terahertz waveguides using terahertz near-field microscopy

Oleg Mitrofanov, Thomas Tan, Paul R. Mark, Bradley Bowden, James Harrington

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Mode structure, transmission loss and dispersion are characterized in low-loss (~1dB/m) Terahertz (THz) dielectric-lined hollow metallic waveguides. THz near-field probe imaging and spectroscopy is applied for precise mode imaging and selective mode probing.

Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2009
StatePublished - Dec 1 2009
EventConference on Lasers and Electro-Optics, CLEO 2009 - Baltimore, MD, United States
Duration: May 31 2009Jun 5 2009

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherConference on Lasers and Electro-Optics, CLEO 2009
CountryUnited States
CityBaltimore, MD
Period5/31/096/5/09

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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