Nanoporous, low-dielectric constant organosilicate materials derived from inorganic polymer blends

R. D. Miller, W. Volksen, V. Y. Lee, E. Connor, T. Magbitang, R. Zafran, L. Sundberg, C. J. Hawker, J. L. Hedrick, E. Huang, M. Toney, Q. R. Huang, C. W. Frank, H. C. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Porous materials will be needed to reach the ultralow-k dielectric on-chip insulator objectives for advanced semiconductor chips. Nanoporous organosilicates can be prepared using thermally labile macromolecular porogens and silsesquioxane resins. This process readily achieves dielectric constants of 1.5. There is a significant difference in porous morphologies depending on whether the porogens function by nucleation and growth or an actual templating mechanism.

Original languageEnglish (US)
Title of host publicationPolymers for Microelectronics and Nanoelectronics
PublisherAmerican Chemical Society
Pages144-160
Number of pages17
ISBN (Print)9780841238572
DOIs
StatePublished - 2004

Publication series

NameACS Symposium Series
Volume874
ISSN (Print)0097-6156

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Chemical Engineering(all)

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