Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films

M. Abazari; T. Choi; S. W. Cheong; A. Safari

doi:10.1088/0022-3727/43/2/025405

Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films

M. Abazari, T. Choi, S. W. Cheong, A. Safari

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K_0.44,Na_0.52,Li_0.04) (Nb_0.84,Ta_0.1,Sb_0.06)O₃ (KNN-LT-LS) thin films on SrTiO₃ substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coefficient (d₃₃) of the films were calculated using piezoelectric displacement curves and shown to be ∼53 pm V^-1 for pure KNN-LT-LS thin films. This value is among the highest values reported for an epitaxial lead-free thin film and shows a great potential for KNN-LT-LS to serve as an alternative to PZT thin films in future applications.

Original language	English (US)
Article number	025405
Journal	Journal of Physics D: Applied Physics
Volume	43
Issue number	2
DOIs	https://doi.org/10.1088/0022-3727/43/2/025405
State	Published - 2010

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Acoustics and Ultrasonics
Surfaces, Coatings and Films

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10.1088/0022-3727/43/2/025405

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title = "Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films",

abstract = "We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K0.44,Na0.52,Li0.04) (Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coefficient (d33) of the films were calculated using piezoelectric displacement curves and shown to be ∼53 pm V-1 for pure KNN-LT-LS thin films. This value is among the highest values reported for an epitaxial lead-free thin film and shows a great potential for KNN-LT-LS to serve as an alternative to PZT thin films in future applications.",

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AU - Abazari, M.

AU - Choi, T.

AU - Cheong, S. W.

AU - Safari, A.

PY - 2010

Y1 - 2010

N2 - We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K0.44,Na0.52,Li0.04) (Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coefficient (d33) of the films were calculated using piezoelectric displacement curves and shown to be ∼53 pm V-1 for pure KNN-LT-LS thin films. This value is among the highest values reported for an epitaxial lead-free thin film and shows a great potential for KNN-LT-LS to serve as an alternative to PZT thin films in future applications.

AB - We report the observation of domain structure and piezoelectric properties of pure and Mn-doped (K0.44,Na0.52,Li0.04) (Nb0.84,Ta0.1,Sb0.06)O3 (KNN-LT-LS) thin films on SrTiO3 substrates. It is revealed that, using piezoresponse force microscopy, ferroelectric domain structure in such 500 nm thin films comprised of primarily 180° domains. This was in accordance with the tetragonal structure of the films, confirmed by relative permittivity measurements and x-ray diffraction patterns. Effective piezoelectric coefficient (d33) of the films were calculated using piezoelectric displacement curves and shown to be ∼53 pm V-1 for pure KNN-LT-LS thin films. This value is among the highest values reported for an epitaxial lead-free thin film and shows a great potential for KNN-LT-LS to serve as an alternative to PZT thin films in future applications.

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Nanoscale characterization and local piezoelectric properties of lead-free KNN-LT-LS thin films

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