On the stability and oxidation of single crystal (100) InAs surfaces

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report on a method to prepare clean and smooth surfaces of InAs (100) along with in-situ high-resolution studies of the nanoscale oxidation of the pristine surface. A hydrogen molecular cleaning (HMC) technique has been developed that results in complete removal of native oxide This has been verified in-depth by in-situ nuclear reaction analysis (NRA) using the 16O(d,p) 17O reaction and X-ray photoelectron spectroscopy. Further, ion channeling studies have been performed to verify atomically smooth surfaces after post cleaning We derive kinetic boundaries for oxide formation on cleaned InAs surfaces using NRA measurements.

Original languageEnglish (US)
Title of host publicationECS Transactions - 5th International Symposium on High Dielectric Constant Materials and Gate Stacks
PublisherElectrochemical Society Inc.
Pages409-419
Number of pages11
Edition4
ISBN (Electronic)9781566775700
ISBN (Print)9781566775700
DOIs
StatePublished - 2007
Externally publishedYes
Event5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting - Washington, DC, United States
Duration: Oct 8 2007Oct 10 2007

Publication series

NameECS Transactions
Number4
Volume11
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

Other5th International Symposium on High Dielectric Constant Materials and Gate Stacks - 212th ECS Meeting
Country/TerritoryUnited States
CityWashington, DC
Period10/8/0710/10/07

All Science Journal Classification (ASJC) codes

  • General Engineering

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