@inproceedings{f5bf4b284d4b4762af1518947cb53dd3,
title = "Optimal burn-in for n-subpopulations with stochastic degradation",
abstract = "Often within any population of components there are strong and weak subpopulations, most notably in advanced electronic products. Burn-in test is often used to eliminate the early failures and reduce the warranty cost for those devices. This paper considers a burn-in process for a degradation-based heterogeneous population. An optimization model is formulated to achieve the optimal burn-in time. Numerical examples are provided to demonstrate the effectiveness of the burn-in process.",
keywords = "Brownian motion with drift, burn-in, heterogeneous population",
author = "Yisha Xiang and Coit, {David W.} and Qianmei Feng",
year = "2011",
doi = "10.1109/ICQR2MSE.2011.5976586",
language = "English (US)",
isbn = "9781457712326",
series = "ICQR2MSE 2011 - Proceedings of 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering",
pages = "148--152",
booktitle = "ICQR2MSE 2011 - Proceedings of 2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering",
note = "2011 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, ICQR2MSE 2011 ; Conference date: 17-06-2011 Through 19-06-2011",
}