Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates

Hao Li; H. Zheng; L. Salamanca-Riba; R. Ramesh; I. Naumov; K. Rabe

doi:10.1063/1.1523632

Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba_0.5Sr_0.5TiO₃ films grown on MgO substrates

Hao Li, H. Zheng, L. Salamanca-Riba, R. Ramesh, I. Naumov, K. Rabe

School of Arts and Sciences, Physics & Astronomy

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba_0.5Sr_0.5TiO₃ films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.

Original language	English (US)
Pages (from-to)	4398-4400
Number of pages	3
Journal	Applied Physics Letters
Volume	81
Issue number	23
DOIs	https://doi.org/10.1063/1.1523632
State	Published - Dec 2 2002

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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abstract = "The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.",

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AU - Li, Hao

AU - Zheng, H.

AU - Salamanca-Riba, L.

AU - Ramesh, R.

AU - Naumov, I.

AU - Rabe, K.

PY - 2002/12/2

Y1 - 2002/12/2

N2 - The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.

AB - The origin of antiphase domain boundaries (ADB) and their effect on the dielectric constant of Ba0.5Sr0.5TiO3 films grown on MgO substrates were discussed. The formation of ADBs was attributed to different crystal symmetry of the film and the substrate. The analysis showed that upon annealing the density of ADBs decreased and the dielectric properties improved.

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Origin of antiphase domain boundaries and their effect on the dielectric constant of Ba_0.5Sr_0.5TiO₃ films grown on MgO substrates

Abstract

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